Tuning & Scan
Tuning
Digital Test
KEK132
RJ1 |
RJ2 |
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KEK133
RJ1 |
RJ2 |
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KEK134
RJ1 |
RJ2 |
|
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KEK141
RJ1 |
RJ2 |
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KEK142
RJ1 |
RJ2 |
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KEK144
RJ1 |
RJ2 |
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Analog Test
KEK132
RJ1 |
RJ2 |
|
|
KEK133
RJ1 |
RJ2 |
|
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KEK134
RJ1 |
RJ2 |
|
|
KEK141
RJ1 |
RJ2 |
|
|
KEK142
RJ1 |
RJ2 |
|
|
KEK144
RJ1 |
RJ2 |
|
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Threshold tuning
KEK132
RJ1 |
RJ2 |
|
|
KEK133
RJ1 |
RJ2 |
|
|
KEK134
RJ1 |
RJ2 |
|
|
KEK141
RJ1 |
RJ2 |
|
|
KEK142
RJ1 |
RJ2 |
|
|
KEK144
RJ1 |
RJ2 |
|
|
Threshold Noise2d
KEK132
RJ1 |
RJ2 |
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KEK133
RJ1 |
RJ2 |
|
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KEK134
RJ1 |
RJ2 |
|
|
KEK141
RJ1 |
RJ2 |
|
|
KEK142
RJ1 |
RJ2 |
|
|
KEK144
RJ1 |
RJ2 |
|
|
Source Scan
Source Scanは全て90Srを用いてバイアス-50Vで30秒間測定
モジュール過熱防止のため恒温槽-15℃内に設置
KEK132
RJ1 |
RJ2 |
|
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KEK133
RJ1 |
RJ2 |
|
|
->RJ1右側、RJ2大部分がバンプオープン
KEK134
RJ1 |
RJ2 |
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->RJ2上部がバンプオープン
KEK141
RJ1 |
RJ2 |
|
|
->RJ2右上部分がバンプオープン
KEK142
RJ1 |
RJ2 |
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->RJ1上部、RJ2下部がバンプオープン
KEK144
RJ1 |
RJ2 |
|
|
->RJ1の2(68~70)x112(0~112)部分がDigital dead(?)、RJ2下部がバンプオープン
--
Atlasj Silicon - 2018-02-02
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